Invention Grant
US08124494B2 Method for reshaping silicon surfaces with shallow trench isolation
有权
用浅沟槽隔离重新形成硅表面的方法
- Patent Title: Method for reshaping silicon surfaces with shallow trench isolation
- Patent Title (中): 用浅沟槽隔离重新形成硅表面的方法
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Application No.: US11778558Application Date: 2007-07-16
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Publication No.: US08124494B2Publication Date: 2012-02-28
- Inventor: Yu-Hsiung Wang , Wen-Ting Chu , Eric Chen , Hsien-Wei Chin
- Applicant: Yu-Hsiung Wang , Wen-Ting Chu , Eric Chen , Hsien-Wei Chin
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L21/76
- IPC: H01L21/76

Abstract:
A method for making a semiconductor device by reshaping a silicon surface with a sacrificial layer is presented. In the present invention the steps of forming a sacrificial dielectric layer and removing the sacrificial dielectric layer are repeated multiple times in order to remove sharp edges from the silicon surface near the field oxides. Another aspect of the present invention includes making a MOSFET transistor that incorporates the forming and removing of multiple sacrificial layers into the process.
Public/Granted literature
- US20090023255A1 Method for Reshaping Silicon Surfaces with Shallow Trench Isolation Public/Granted day:2009-01-22
Information query
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