Invention Grant
- Patent Title: Method for fabricating semiconductor substrates and semiconductor devices
- Patent Title (中): 制造半导体衬底和半导体器件的方法
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Application No.: US12489688Application Date: 2009-06-23
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Publication No.: US08133803B2Publication Date: 2012-03-13
- Inventor: Yuh-Jen Cheng , Ming-Hua Lo , Hao-Chung Kuo
- Applicant: Yuh-Jen Cheng , Ming-Hua Lo , Hao-Chung Kuo
- Applicant Address: TW Nankang Taipei
- Assignee: Academia Sinica
- Current Assignee: Academia Sinica
- Current Assignee Address: TW Nankang Taipei
- Agency: Cozen O'Connor
- Main IPC: H01L21/20
- IPC: H01L21/20 ; H01L21/36

Abstract:
A method for fabricating a semiconductor layer comprising: a) growing a semiconductor layer on a foreign substrate; b) forming at least one opening on the semiconductor layer, wherein the opening exposes the interface between the semiconductor layer and the foreign substrate; and c) removing at least part of the semiconductor solid state material along the interface between the semiconductor layer and the foreign substrate. The removing step c) is preferably achieved by selective interfacial chemical etching. The semiconductor layer may be utilized as a substrate for fabrication of a wide variety of electronic and opto-electronic devices and integrated circuitry products.
Public/Granted literature
- US20100323506A1 Method for fabricating semiconductor substrates and semiconductor devices Public/Granted day:2010-12-23
Information query
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