Invention Grant
- Patent Title: Multiple beam charged particle optical system
- Patent Title (中): 多光束带电粒子光学系统
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Application No.: US11880872Application Date: 2007-07-23
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Publication No.: US08134135B2Publication Date: 2012-03-13
- Inventor: Pieter Kruit , Yanxia Zhang , Martijn J. Van Bruggen , Stijn Willem Herman Karel Steenbrink
- Applicant: Pieter Kruit , Yanxia Zhang , Martijn J. Van Bruggen , Stijn Willem Herman Karel Steenbrink
- Applicant Address: NL Delft
- Assignee: Mapper Lithography IP B.V.
- Current Assignee: Mapper Lithography IP B.V.
- Current Assignee Address: NL Delft
- Agency: Blakely, Sokoloff, Taylor & Zafman
- Main IPC: H01J37/302
- IPC: H01J37/302 ; H01J37/04

Abstract:
The invention relates to a multiple beam charged particle optical system, comprising an electrostatic lens structure with at least one electrode, provided with apertures, wherein the effective size of a lens field effected by said electrode at a said aperture is made ultimately small. The system may comprise a diverging charged particle beam part, in which the lens structure is included. The physical dimension of the lens is made ultimately small, in particular smaller than one mm, more in particular less than a few tens of microns. In further elaboration, a lens is combined with a current limiting aperture, aligned such relative to a lens of said structure, that a virtual aperture effected by said current limiting aperture in said lens is situated in an optimum position with respect to minimizing aberrations total.
Public/Granted literature
- US20080023643A1 Multiple beam charged particle optical system Public/Granted day:2008-01-31
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