Invention Grant
US08136066B2 Apparatus and computer program product for semiconductor yield estimation
有权
用于半导体产量估算的装置和计算机程序产品
- Patent Title: Apparatus and computer program product for semiconductor yield estimation
- Patent Title (中): 用于半导体产量估算的装置和计算机程序产品
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Application No.: US12325774Application Date: 2008-12-01
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Publication No.: US08136066B2Publication Date: 2012-03-13
- Inventor: Jeanne Paulette Spence Bickford , Jason D. Hibbeler , Juergen Koehl , William John Livingstone , Daniel Nelson Maynard
- Applicant: Jeanne Paulette Spence Bickford , Jason D. Hibbeler , Juergen Koehl , William John Livingstone , Daniel Nelson Maynard
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent Richard Kotulak
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
A method, apparatus, system, and computer program product that performs yield estimates using critical area analysis on integrated circuits having redundant and non-redundant elements. The non-redundant elements are ignored or removed from the critical area analysis performed for undesired opens.
Public/Granted literature
- US20090113364A1 APPARATUS AND COMPUTER PROGRAM PRODUCT FOR SEMICONDUCTOR YIELD ESTIMATION Public/Granted day:2009-04-30
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