A test circuit adapted in a display panel of an electronic device is provided. The test circuit is to test the pixel array function of the display panel, wherein the test circuit comprises: a plurality of test signal lines, a plurality of test signal transmitters, a plurality of gate lines and at least one static electricity protection device. The test signal lines receive a plurality of corresponding test signals respectively. The test signal transmitters comprises a plurality test signal transmitter groups comprising at least one transmitter, wherein each transmitter group corresponds to a test signal line and connects the test signal line and the to pixel array. Each gate line connects to the gate of the at least one transmitter. The static electricity protection device is placed between two of the gate lines.