发明授权
- 专利标题: Method and apparatus for manufacturing magnetoresistive element
- 专利标题(中): 用于制造磁阻元件的方法和装置
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申请号: US12248578申请日: 2008-10-09
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公开(公告)号: US08153188B2公开(公告)日: 2012-04-10
- 发明人: Hideaki Fukuzawa , Katsuhiko Koui , Hiromi Yuasa , Susumu Hashimoto , Hitoshi Iwasaki
- 申请人: Hideaki Fukuzawa , Katsuhiko Koui , Hiromi Yuasa , Susumu Hashimoto , Hitoshi Iwasaki
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2004-233641 20040810
- 主分类号: G11B5/127
- IPC分类号: G11B5/127 ; G11B5/00 ; G11B5/62 ; H05H1/00
摘要:
The present invention relates to a method for manufacturing a magnetoresistive element having a magnetization pinned layer, a magnetization free layer, and a spacer layer including an insulating layer provided between the magnetization pinned layer and the magnetization free layer and current paths penetrating into the insulating layer. A process of forming the spacer layer in the method includes depositing a first metal layer forming the metal paths, depositing a second metal layer on the first metal layer, performing a pretreatment of irradiating the second metal layer with an ion beam or a RF plasma of a rare gas, and converting the second metal layer into the insulating layer by means of supplying an oxidation gas or a nitriding gas.
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