Invention Grant
US08154307B2 Electronic circuit comprising a device to measure phase noise of an oscillating and/or resonant device
有权
电子电路包括测量振荡和/或谐振装置的相位噪声的装置
- Patent Title: Electronic circuit comprising a device to measure phase noise of an oscillating and/or resonant device
- Patent Title (中): 电子电路包括测量振荡和/或谐振装置的相位噪声的装置
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Application No.: US12233421Application Date: 2008-09-18
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Publication No.: US08154307B2Publication Date: 2012-04-10
- Inventor: Andrea Cathelin , Sylvain Godet , Olivier Llopis , Éric Tournier , Stephane Thuries
- Applicant: Andrea Cathelin , Sylvain Godet , Olivier Llopis , Éric Tournier , Stephane Thuries
- Applicant Address: FR Montrouge FR Paris
- Assignee: STMicroelectronics S.A.,Centre National de la Recherche Scientifique
- Current Assignee: STMicroelectronics S.A.,Centre National de la Recherche Scientifique
- Current Assignee Address: FR Montrouge FR Paris
- Agency: Gardere Wynne Sewell LLP
- Priority: FR0757729 20070920
- Main IPC: G01R29/26
- IPC: G01R29/26 ; G01R23/20
Abstract:
An electronic circuit includes several (at least two) oscillating and/or resonant devices. The circuit uses a measuring device to measure the phase noise of one of the two oscillating/resonant devices. This measuring device is integrated on a chip on which the oscillating/resonant device to be measured is also integrated. The circuits and methods described find application in the area of radiofrequency/high frequency electronics RF/HF, in particular adapted to general public applications in mobile communication systems and/or to metrology.
Public/Granted literature
- US20090079441A1 ELECTRONIC CIRCUIT COMPRISING A DEVICE TO MEASURE PHASE NOISE OF AN OSCILLATING AND/OR RESONANT DEVICE Public/Granted day:2009-03-26
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