Invention Grant
- Patent Title: Process for forming a silicon-based single-crystal portion
- Patent Title (中): 用于形成硅基单晶部分的方法
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Application No.: US11788391Application Date: 2007-04-18
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Publication No.: US08158495B2Publication Date: 2012-04-17
- Inventor: Didier Dutartre , Laurent Rubaldo , Alexandre Talbot
- Applicant: Didier Dutartre , Laurent Rubaldo , Alexandre Talbot
- Applicant Address: FR Montrouge
- Assignee: STMicroelectronics S.A.
- Current Assignee: STMicroelectronics S.A.
- Current Assignee Address: FR Montrouge
- Agency: Gardere Wynne Sewell LLP
- Priority: FR0603453 20060419
- Main IPC: H01L21/302
- IPC: H01L21/302

Abstract:
Silicon-based single-crystal portions are produced on a surface of a substrate, selectively in zones where a single-crystal material is initially exposed. To do this, a layer is firstly formed over the entire surface of the substrate, using a silicon precursor of the non-chlorinated hydride type, and under suitable conditions so that the layer is a single-crystal layer in the zones of the substrate where a single-crystal material is initially exposed and amorphous outside these zones. The amorphous portions of the layer are then selectively etched so that only the single-crystal portions of the layer remain on the substrate.
Public/Granted literature
- US20070254451A1 Process for forming a silicon-based single-crystal portion Public/Granted day:2007-11-01
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