Invention Grant
- Patent Title: Method of optimizing the behavior of a force-measuring device, and force-measuring device
- Patent Title (中): 优化力测量装置和力测量装置的行为的方法
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Application No.: US11471638Application Date: 2006-06-21
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Publication No.: US08168898B2Publication Date: 2012-05-01
- Inventor: Daniel Reber , Marc Nussbaumer , Martin Rickli
- Applicant: Daniel Reber , Marc Nussbaumer , Martin Rickli
- Applicant Address: CH Greifensee
- Assignee: Mettler-Toledo AG
- Current Assignee: Mettler-Toledo AG
- Current Assignee Address: CH Greifensee
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: EP05105423 20050621
- Main IPC: G01L1/00
- IPC: G01L1/00 ; G01G23/01

Abstract:
A method serves to optimize the behavior of an electronic force-measuring device, in particular a balance that comprises a measuring transducer through which a measuring signal is formed which is representative of a load applied to the force-measuring device, which measuring signal is delivered to a signal-processing unit that is supported by at least one processor and at least one memory storage unit and serves to process digital signals. First characteristic traits for the condition of the force-measuring device are determined, the first characteristic traits being the result of internal and/or external factors affecting the force-measuring device, and/or second characteristic traits for the force-measuring device are determined from the analysis of at least one signal profile of the measuring signal, whereupon the condition of the force-measuring device is determined on the basis of the first and/or second characteristic traits, and the further processing of the measuring signal and/or the operation of the force-measuring device is controlled accordingly. Based on the condition of the force-measuring device that was determined, the processing or evaluation of the signal as well as the use of optimizing measures that serve to determine, e.g., optimized correction parameters such as drift parameters or filter parameters can be advantageously controlled.
Public/Granted literature
- US20070007050A1 Method of optimizing the behavior of a force-measuring device, and force-measuring device Public/Granted day:2007-01-11
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