发明授权
- 专利标题: Semiconductor material for radiation absorption and detection
- 专利标题(中): 用于辐射吸收和检测的半导体材料
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申请号: US12211894申请日: 2008-09-17
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公开(公告)号: US08178008B2公开(公告)日: 2012-05-15
- 发明人: Brent Allen Clothier , Adrian Ivan , Daniel Bruno McDevitt
- 申请人: Brent Allen Clothier , Adrian Ivan , Daniel Bruno McDevitt
- 申请人地址: US NY Niskayuna
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Niskayuna
- 代理商 Ann M. Agosti
- 主分类号: H01M4/88
- IPC分类号: H01M4/88
摘要:
A semiconductor material for radiation absorption and detection comprising a composition of stoichiometry Li(M12+, M22+, M32+, . . . )(G1V, G2V, G3V, . . . ) and exhibiting an antifluorite-type order, where Li=1, (M12++M22++M32++ . . . )=1, and (G1V+G2V+G3V+ . . . )=1. The material provides two useful characteristics: [1] a high Li-site density, which when enriched in 6Li, produces exceptional neutron-absorbing capabilities and [2] a semiconducting band-gap for the efficient conversion of absorbed photon and neutron energies into electrical currents. These characteristics can be exploited in applications for power generation or the spectroscopic detection of gamma and neutron radiation. The material can be tailored so as to detect only gamma photons, detect only neutron particles, or simultaneously detect gamma photons and neutron particles.
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