Invention Grant
- Patent Title: Dual port static random access memory cell layout
- Patent Title (中): 双端口静态随机存取存储单元布局
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Application No.: US12899663Application Date: 2010-10-07
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Publication No.: US08183639B2Publication Date: 2012-05-22
- Inventor: Pierre Malinge , Jack M. Higman , Sanjay R. Parihar
- Applicant: Pierre Malinge , Jack M. Higman , Sanjay R. Parihar
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Daniel D. Hill; James L. Clingan, Jr.
- Main IPC: H01L21/70
- IPC: H01L21/70

Abstract:
A dual port static random access memory cell has pull-down transistors, pull-up transistors, and pass transistors. A first active region has a first pull-down transistor coupled to a true data node, a second pull-down transistor coupled to a complementary data node; a first pass transistor coupled to the true data node, and a second pass transistor coupled to the complementary data node. A second active region has the same size and shape as the first active region and has a third pull-down transistor coupled in parallel to the first-pull down transistor, a fourth pull-down transistor coupled in parallel to the second pull-down transistor; a third pass transistor coupled to the true data node, and a fourth pass transistor coupled to the complementary data node. A first pull-up transistor and a second pull-up transistor are located between the first and second active regions.
Public/Granted literature
- US20120086082A1 DUAL PORT STATIC RANDOM ACCESS MEMORY CELL LAYOUT Public/Granted day:2012-04-12
Information query
IPC分类: