发明授权
US08185337B1 System, method, and computer program product for testing and re-testing integrated circuits
有权
用于测试和重新测试集成电路的系统，方法和计算机程序产品
- 专利标题： System, method, and computer program product for testing and re-testing integrated circuits
- 专利标题（中）： 用于测试和重新测试集成电路的系统，方法和计算机程序产品
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申请号： US12902090申请日： 2010-10-11
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公开(公告)号： US08185337B1公开(公告)日： 2012-05-22
- 发明人: Maxim Zverez , Paul Brandariz , Robert Easton , Jason Saw
- 申请人： Maxim Zverez , Paul Brandariz , Robert Easton , Jason Saw
- 申请人地址： US CA San Jose
- 专利权人： Invantest, Inc.
- 当前专利权人： Invantest, Inc.
- 当前专利权人地址： US CA San Jose
- 代理机构： Zilka-Kotab, PC
- 主分类号： G01R31/00
- IPC分类号： G01R31/00 ; G01R31/14 ; G01R31/26
摘要：
A system, method, and computer program product are provided for testing and re-testing integrated circuits. In use, a group of integrated circuits is tested. In use, before finishing the test, at least one of the integrated circuits of the group is re-tested.
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