发明授权
US08185859B2 System and method to improve chip yield, reliability and performance
有权
提高芯片产量,可靠性和性能的系统和方法
- 专利标题: System and method to improve chip yield, reliability and performance
- 专利标题(中): 提高芯片产量,可靠性和性能的系统和方法
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申请号: US11763781申请日: 2007-06-15
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公开(公告)号: US08185859B2公开(公告)日: 2012-05-22
- 发明人: Henry A. Bonges, III
- 申请人: Henry A. Bonges, III
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Roberts Mlotkowski Safran & Cole, P.C.
- 代理商 Richard Kotulak
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
Improving semiconductor chip yield and reliability by connecting adjacent metal traces that are on a same network with metal shorts. This reduces and/or eliminates the need for redundant vias formerly employed in semiconductor chip design. Additionally, the metal shorts are placed in conformance with one or more pre-determined design rules. Once placed, the metal shorts are checked to ensure that each metal short connects groundrule clean, thereby ensuring the placement is correct-by-construction.
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