发明授权
US08185859B2 System and method to improve chip yield, reliability and performance 有权
提高芯片产量,可靠性和性能的系统和方法

System and method to improve chip yield, reliability and performance
摘要:
Improving semiconductor chip yield and reliability by connecting adjacent metal traces that are on a same network with metal shorts. This reduces and/or eliminates the need for redundant vias formerly employed in semiconductor chip design. Additionally, the metal shorts are placed in conformance with one or more pre-determined design rules. Once placed, the metal shorts are checked to ensure that each metal short connects groundrule clean, thereby ensuring the placement is correct-by-construction.
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