Invention Grant
- Patent Title: Device and method for temperature compensation testing of digital load cells
- Patent Title (中): 数字称重传感器温度补偿测试装置及方法
-
Application No.: US12418078Application Date: 2009-04-03
-
Publication No.: US08191434B2Publication Date: 2012-06-05
- Inventor: Daniel Reber , Urs Loher , Aaron Skidmore
- Applicant: Daniel Reber , Urs Loher , Aaron Skidmore
- Applicant Address: US OH Columbus
- Assignee: Mettler-Toledo, LLC
- Current Assignee: Mettler-Toledo, LLC
- Current Assignee Address: US OH Columbus
- Agency: Standley Law Group LLP
- Main IPC: G01L1/04
- IPC: G01L1/04

Abstract:
A device and method for effectuating the temperature compensation testing of digital load cells. The device uses conductive heat transfer to establish and maintain the temperature of the load cell(s) during testing. The device may include a vessel into which one or more load cells to be tested are placed. Temperature control of the load cells may be accomplished by circulating a temperature controlled fluid through the vessel. The vessel containing the one or more load cells may then be placed in a load application device that applies a load(s) to the one or more load cells during testing. Readings from the one or more load cells are used to establish a temperature compensation factor for each load cell tested. In other embodiments, temperature control of the load cells may be accomplished by placing the load cells in contact with a solid heat transfer element(s).
Public/Granted literature
- US20100251833A1 DEVICE AND METHOD FOR TEMPERATURE COMPENSATION TESTING OF DIGITAL LOAD CELLS Public/Granted day:2010-10-07
Information query