发明授权
- 专利标题: Near-infrared photodetectors, image sensors employing the same, and methods of manufacturing the same
- 专利标题(中): 近红外光电探测器,采用其的图像传感器及其制造方法
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申请号: US12656684申请日: 2010-02-12
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公开(公告)号: US08193497B2公开(公告)日: 2012-06-05
- 发明人: Yoon-dong Park , David Andrew Barclay Miller , Young-gu Jin , In-sung Joe
- 申请人: Yoon-dong Park , David Andrew Barclay Miller , Young-gu Jin , In-sung Joe
- 申请人地址: KR Gyeonggi-do US CA Palo Alto
- 专利权人: Samsung Electronics Co., Ltd.,The Board of Trustees of the Leland Stanford Junior University
- 当前专利权人: Samsung Electronics Co., Ltd.,The Board of Trustees of the Leland Stanford Junior University
- 当前专利权人地址: KR Gyeonggi-do US CA Palo Alto
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 主分类号: H01L27/148
- IPC分类号: H01L27/148
摘要:
Silicon photodetectors using near-infrared dipole antennas. The photodetectors include a silicon region formed on a semiconductor substrate, dipole antenna forming two arms that are spaced apart with the silicon region therebetween and inducing an electromagnetic wave signal of incident light, and electrodes disposed in a vertical direction of the dipole antenna and spaced apart with the silicon region therebetween, where a critical bias voltage is applied to the electrodes to induce an avalanche gain operation in the silicon region.
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