Invention Grant
- Patent Title: Measuring instrument and measuring method
- Patent Title (中): 测量仪器和测量方法
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Application No.: US12360178Application Date: 2009-01-27
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Publication No.: US08198592B2Publication Date: 2012-06-12
- Inventor: Yoshimasa Suzuki , Mitsuru Namiki
- Applicant: Yoshimasa Suzuki , Mitsuru Namiki
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Pillsbury Winthrop Shaw Pittman, LLP
- Priority: JP2008-016528 20080128
- Main IPC: G01N21/64
- IPC: G01N21/64

Abstract:
A measuring instrument has a light source for irradiating light including rays of light having the wavelength of excitation light, an objective lens for focusing light irradiated from the light source to a predetermined focusing position, a first mirror for directly reflecting light from the objective lens, a second mirror for reflecting light reflected by the first mirror, the second mirror having an aperture P, and a measuring device for measuring light generated from a sample and having a wavelength different from the wavelength of excitation light, and the sample being arranged between the first mirror and the second mirror, the focusing position of the objective lens being made to agree with the position of the aperture P, and the measuring device being adapted to measure light of a wavelength different from the wavelength of excitation light generated from the sample and passing through the aperture P.
Public/Granted literature
- US20090189080A1 MEASURING INSTRUMENT AND MEASURING METHOD Public/Granted day:2009-07-30
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