发明授权
- 专利标题： Semiconductor device capable of suppressing a coupling effect of a test-disable transmission line
- 专利标题（中）： 能够抑制测试禁止传输线的耦合效应的半导体器件
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申请号： US13229086申请日： 2011-09-09
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公开(公告)号： US08203897B2公开(公告)日： 2012-06-19
- 发明人: Jeong-Yoon Ahn , Ji-Eun Jang , Young-Jun Ku
- 申请人： Jeong-Yoon Ahn , Ji-Eun Jang , Young-Jun Ku
- 申请人地址： KR Gyeonggi-do
- 专利权人： Hynix Semiconductor Inc.
- 当前专利权人： Hynix Semiconductor Inc.
- 当前专利权人地址： KR Gyeonggi-do
- 代理机构： IP & T Group LLP
- 优先权： KR10-2007-0111351 20071102
- 主分类号： G11C29/00
- IPC分类号： G11C29/00
摘要：
Semiconductor device and semiconductor memory device include a plurality of internal circuits configured to perform test operations in response to their respective test mode signals and a plurality of test-mode control units configured to control the test operations of the internal circuits to be disabled in response to a test-off signal.
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