Invention Grant
US08213257B2 Variation-tolerant word-line under-drive scheme for random access memory
有权
用于随机存取存储器的容错字线驱动方案
- Patent Title: Variation-tolerant word-line under-drive scheme for random access memory
- Patent Title (中): 用于随机存取存储器的容错字线驱动方案
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Application No.: US12852759Application Date: 2010-08-09
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Publication No.: US08213257B2Publication Date: 2012-07-03
- Inventor: Ching-Te Chuang , Yi-Wei Lin , Chia-Cheng Chen , Wei-Chiang Shih
- Applicant: Ching-Te Chuang , Yi-Wei Lin , Chia-Cheng Chen , Wei-Chiang Shih
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu TW Hsinchu
- Assignee: Faraday Technology Corp.,National Chiao Tung University
- Current Assignee: Faraday Technology Corp.,National Chiao Tung University
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu TW Hsinchu
- Agent Winston Hsu; Scott Margo
- Main IPC: G11C8/00
- IPC: G11C8/00

Abstract:
A Random Access Memory (RAM) is provided. The RAM includes a plurality of word-line drivers, at least a first tracking transistor and a second tracking transistor. Each word-line driver has an input node receiving a decoding signal, a power node receiving an operation voltage and a driving node driving a word-line. In an embodiment, the first tracking transistor has two channel terminal nodes respectively coupled to the driving node of one of the word-line driver and a channel terminal node of the second tracking transistor; wherein the first tracking transistor has electronic characteristics tracking those of a driving transistor of word-line driver, and the second tracking transistor has electronic characteristics tracking those of pass-gate transistor(s) in each cell of the RAM.
Public/Granted literature
- US20120033522A1 VARIATION-TOLERANT WORD-LINE UNDER-DRIVE SCHEME FOR RANDOM ACCESS MEMORY Public/Granted day:2012-02-09
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