Invention Grant
- Patent Title: Method for testing a control apparatus and test device
- Patent Title (中): 用于测试控制装置和测试装置的方法
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Application No.: US12703917Application Date: 2010-02-11
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Publication No.: US08214690B2Publication Date: 2012-07-03
- Inventor: Klaus Lamberg , Christine Thiessen , Matthias Schnelte
- Applicant: Klaus Lamberg , Christine Thiessen , Matthias Schnelte
- Applicant Address: DE Paderborn
- Assignee: dSPACE digital signal processing and control engineering GmbH
- Current Assignee: dSPACE digital signal processing and control engineering GmbH
- Current Assignee Address: DE Paderborn
- Agency: Orrick Herrington & Sutcliffe, LLP
- Priority: EP09002479 20090220
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A method is described and represented for testing a control apparatus with a test device, where the control apparatus has at least one state variable and at least one actual functionality that contains a time dependency, and the control apparatus and the test device are connected to each other via a signal interface.The problem of the present invention is to prevent—at least partially—the disadvantages known from the state of the art, and, particularly, to provide a method for testing a control apparatus, which allows as simple and flexible an acquisition of the target functionality of a control apparatus is possible, and which takes into account the time dependency of the target functionality as comprehensively as possible during the test case generation.
Public/Granted literature
- US20100218046A1 Method For Testing A Control Apparatus And Test Device Public/Granted day:2010-08-26
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