发明授权
- 专利标题: Structure to reduce etching residue
- 专利标题(中): 结构减少蚀刻残留
-
申请号: US12952485申请日: 2010-11-23
-
公开(公告)号: US08217499B2公开(公告)日: 2012-07-10
- 发明人: Tsung-Yuan Yu , Hsien-Wei Chen , Chung-Ying Yang
- 申请人: Tsung-Yuan Yu , Hsien-Wei Chen , Chung-Ying Yang
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater & Matsil, L.L.P.
- 主分类号: H01L23/544
- IPC分类号: H01L23/544
摘要:
A structure for reducing partially etched materials is described. The structure includes a layout of an intersection area between two trenches. First, a large intersection area having a trapezoidal corner may be replaced with an orthogonal intersection between two trenches. The layout reduces the intersection area as well as the possibility of having partially etched materials left at the intersection area. The structure also includes an alternative way to fill the intersection area with either an un-etched small trapezoidal area or multiple un-etched square areas, so that the opening area at the intersection point is reduced and the possibility of having partially etched materials is reduced too.
公开/授权文献
- US20120126359A1 Structure to Reduce Etching Residue 公开/授权日:2012-05-24
信息查询
IPC分类: