Invention Grant
- Patent Title: Magnetic-recording-disk test-head and method of manufacturing a magnetic-recording disk using the magnetic-recording-disk test-head
- Patent Title (中): 磁记录盘测试头和使用磁记录盘测试头制造磁记录盘的方法
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Application No.: US12537982Application Date: 2009-08-07
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Publication No.: US08221192B2Publication Date: 2012-07-17
- Inventor: Hidekazu Kashiwase , Hiroyuki Suzuki , Mitsuhiro Shoda , Takayoshi Ohtsu , Kiyoshi Hashimoto
- Applicant: Hidekazu Kashiwase , Hiroyuki Suzuki , Masae Suzuki, legal representative , Mitsuhiro Shoda , Takayoshi Ohtsu , Kiyoshi Hashimoto
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies, Netherlands B.V.
- Current Assignee: Hitachi Global Storage Technologies, Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Priority: JP2008-203680 20080807
- Main IPC: B24B49/00
- IPC: B24B49/00
Abstract:
A magnetic-recording-disk test-head. The magnetic-recording-disk test-head includes a slider, a test pad and a slider-surface-shape control mechanism. The slider includes a leading edge and a trailing edge. The test pad is disposed at a trailing-edge side of the slider and is configured to remove and to detect asperities on a magnetic-recording disk. The slider-surface-shape control mechanism is configured to change a shape of an air-bearing surface of the slider and is disposed at a leading-edge side of the slider.
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