Invention Grant
- Patent Title: Method and device for measuring time intervals
- Patent Title (中): 测量时间间隔的方法和装置
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Application No.: US12101814Application Date: 2008-04-11
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Publication No.: US08228763B2Publication Date: 2012-07-24
- Inventor: Stephan Henzler
- Applicant: Stephan Henzler
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Lee & Hayes, PLLC
- Main IPC: G04F8/00
- IPC: G04F8/00 ; H03H11/26
Abstract:
A device is disclosed for measuring a plurality of time intervals.
Public/Granted literature
- US20090257319A1 Method and Device for Measuring Time Intervals Public/Granted day:2009-10-15
Information query
