Invention Grant
US08228923B1 Method and apparatus for measuring system latency using global time stamp
有权
使用全局时间戳测量系统延迟的方法和装置
- Patent Title: Method and apparatus for measuring system latency using global time stamp
- Patent Title (中): 使用全局时间戳测量系统延迟的方法和装置
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Application No.: US11971427Application Date: 2008-01-09
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Publication No.: US08228923B1Publication Date: 2012-07-24
- Inventor: Naveen K. Jain , Venkata Rangavajjhala
- Applicant: Naveen K. Jain , Venkata Rangavajjhala
- Applicant Address: US IL Naperville
- Assignee: Tellabs Operations, Inc.
- Current Assignee: Tellabs Operations, Inc.
- Current Assignee Address: US IL Naperville
- Agency: JW Law Group
- Agent James M. Wu
- Main IPC: H04L12/28
- IPC: H04L12/28 ; H04L12/56 ; H04J3/06 ; H04J3/00

Abstract:
A network device having a system performance measurement unit employing one or more global time stamps for measuring the device performance is disclosed. The device includes an ingress circuit, a global time counter, an egress circuit, and a processor. The ingress circuit is configured to receive a packet from an input port while the global time counter generates an arrival time stamp in accordance with the arrival time of the packet. The egress circuit is capable of forwarding the packet to other network devices via an output port. The processor, in one embodiment, is configured to calculate packet latency in response to the arrival time stamp.
Information query