发明授权
US08238151B2 Transient heat assisted STTRAM cell for lower programming current
有权
瞬态热辅助STTRAM电池用于较低的编程电流
- 专利标题: Transient heat assisted STTRAM cell for lower programming current
- 专利标题(中): 瞬态热辅助STTRAM电池用于较低的编程电流
-
申请号: US12642533申请日: 2009-12-18
-
公开(公告)号: US08238151B2公开(公告)日: 2012-08-07
- 发明人: Jun Liu , Gurtej Sandhu
- 申请人: Jun Liu , Gurtej Sandhu
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Fletcher Yoder
- 主分类号: G11C11/14
- IPC分类号: G11C11/14
摘要:
A memory cell including magnetic materials and heating materials, and methods of programming the memory cell are provided. The memory cell includes a free region, a pinned region, and a heating region configured to generate and transfer heat to the free region when a programming current is directed to the cell. The heat transferred from the heating region increases the temperature of the free region, which decreases the magnetization and the critical switching current density of the free region. In some embodiments, the heating region may also provide a current path to the free region, and the magnetization of the free region may be switched according to the spin polarity of the programming current, programming the memory cell to a high resistance state or a low resistance state.
公开/授权文献
信息查询