发明授权
- 专利标题: Nonvolatile memory devices that utilize error correction estimates to increase reliability of error detection and correction operations
- 专利标题(中): 利用误差校正估计的非易失性存储器件增加错误检测和校正操作的可靠性
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申请号: US12216744申请日: 2008-07-10
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公开(公告)号: US08239747B2公开(公告)日: 2012-08-07
- 发明人: Kyoung Lae Cho , Jae Hong Kim , Yoon Dong Park , Jun Jin Kong , Dong Hyuk Chae
- 申请人: Kyoung Lae Cho , Jae Hong Kim , Yoon Dong Park , Jun Jin Kong , Dong Hyuk Chae
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Myers Bigel Sibley & Sajovec, P.A.
- 优先权: KR10-2008-0015310 20080220
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
Example embodiments may provide a memory device and memory data reading method. The memory device according to example embodiments may include a multi-bit cell array, an error detector which may read a first data page from a memory page in the multi-bit cell array and may detect an error-bit of the first data page, and an estimator which may identify a multi-bit cell where the error-bit is stored and may estimate data stored in the identified multi-bit cell among data of a second data page. Therefore, the memory device and memory data reading method may have an effect of reducing an error when reading data stored in the multi-bit cell and monitoring a state of the multi-bit cell without additional overhead.
公开/授权文献
- US20090210776A1 Memory device and memory data reading method 公开/授权日:2009-08-20
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