Invention Grant
- Patent Title: Nonvolatile memory devices that utilize error correction estimates to increase reliability of error detection and correction operations
- Patent Title (中): 利用误差校正估计的非易失性存储器件增加错误检测和校正操作的可靠性
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Application No.: US12216744Application Date: 2008-07-10
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Publication No.: US08239747B2Publication Date: 2012-08-07
- Inventor: Kyoung Lae Cho , Jae Hong Kim , Yoon Dong Park , Jun Jin Kong , Dong Hyuk Chae
- Applicant: Kyoung Lae Cho , Jae Hong Kim , Yoon Dong Park , Jun Jin Kong , Dong Hyuk Chae
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Priority: KR10-2008-0015310 20080220
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Example embodiments may provide a memory device and memory data reading method. The memory device according to example embodiments may include a multi-bit cell array, an error detector which may read a first data page from a memory page in the multi-bit cell array and may detect an error-bit of the first data page, and an estimator which may identify a multi-bit cell where the error-bit is stored and may estimate data stored in the identified multi-bit cell among data of a second data page. Therefore, the memory device and memory data reading method may have an effect of reducing an error when reading data stored in the multi-bit cell and monitoring a state of the multi-bit cell without additional overhead.
Public/Granted literature
- US20090210776A1 Memory device and memory data reading method Public/Granted day:2009-08-20
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