发明授权
- 专利标题: Smart edge detector
- 专利标题(中): 智能边缘检测器
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申请号: US12706058申请日: 2010-02-16
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公开(公告)号: US08248105B2公开(公告)日: 2012-08-21
- 发明人: Shu-Chun Yang , Jinn-Yeh Chien
- 申请人: Shu-Chun Yang , Jinn-Yeh Chien
- 申请人地址: TW
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW
- 代理机构: Lowe Hauptman Ham & Berner, LLP
- 主分类号: H03K5/22
- IPC分类号: H03K5/22
摘要:
In some embodiments related to a smart edge detector, the smart edge detector uses a second clock in a receiver domain (e.g., clock CLK_D2) to trigger a first flip-flop having a first clock in a transmitter domain (e.g., clock CLK_D1) as input data for the first flip-flop. The clock CLK_D2 through a delay cell also triggers a second flip-flop having the same clock CLK_D1 as input data for the second flip-flop. Based on the output of the first flip-flop (e.g., output S1) and of the second flip-flop (e.g., output S2), the embodiments determine whether the rising and or falling edge of clock CLK_D2 should be used for triggering in a transmitting and receiving application. The embodiments are applicable in both situations where the rising edge or falling edge of clock CLK_D1 is used as a triggering edge. Other embodiments are also disclosed.
公开/授权文献
- US20110199121A1 SMART EDGE DETECTOR 公开/授权日:2011-08-18
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