Invention Grant
- Patent Title: Method of programming a flash memory device
- Patent Title (中): Flash存储设备编程方法
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Application No.: US13008181Application Date: 2011-01-18
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Publication No.: US08254179B2Publication Date: 2012-08-28
- Inventor: Chang-Hyun Lee
- Applicant: Chang-Hyun Lee
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Priority: KR2005-37933 20050506
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A non-volatile memory device includes an array of flash memory cells therein and a voltage generator. The voltage generator is configured to generate a program voltage (Vpgm), a pass voltage (Vpass), a blocking voltage (Vblock) and a decoupling voltage (Vdcp) during a flash memory programming operation. The blocking voltage is generated at a level that inhibits inadvertent programming of an unselected memory cell(s). This voltage level of the blocking voltage is set so that Vdcp
Public/Granted literature
- US20110110161A1 Method of Programming a Flash Memory Device Public/Granted day:2011-05-12
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