发明授权
- 专利标题: Phase detection circuit
- 专利标题(中): 相位检测电路
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申请号: US12018770申请日: 2008-01-23
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公开(公告)号: US08265218B2公开(公告)日: 2012-09-11
- 发明人: Yong Ju Kim , Kun Woo Park , Jong Woon Kim , Hee Woong Song , Ic Su Oh , Hyung Soo Kim , Tae Jin Hwang
- 申请人: Yong Ju Kim , Kun Woo Park , Jong Woon Kim , Hee Woong Song , Ic Su Oh , Hyung Soo Kim , Tae Jin Hwang
- 申请人地址: KR
- 专利权人: SK hynix Inc.
- 当前专利权人: SK hynix Inc.
- 当前专利权人地址: KR
- 代理机构: Baker & McKenzie LLP
- 优先权: KR10-2007-0080621 20070810
- 主分类号: H04L25/00
- IPC分类号: H04L25/00
摘要:
A phase detection circuit includes a phase frequency detector for comparing a first input signal and a second input signal and outputting a first phase comparison signal and a second phase comparison signal, and a sensing circuit for sensing a pulse width difference between the first phase comparison signal and the second phase comparison signal and outputting phase detection signals which have different logic values.
公开/授权文献
- US20090041172A1 PHASE DETECTION CIRCUIT 公开/授权日:2009-02-12
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