Invention Grant
- Patent Title: Image analysis system and image analysis program
- Patent Title (中): 图像分析系统和图像分析程序
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Application No.: US12531123Application Date: 2008-03-10
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Publication No.: US08265398B2Publication Date: 2012-09-11
- Inventor: Hiroshi Fujita , Toshiaki Nakagawa , Yoshinori Hayashi
- Applicant: Hiroshi Fujita , Toshiaki Nakagawa , Yoshinori Hayashi
- Applicant Address: JP Nagoya-shi
- Assignee: Kowa Company, Ltd.
- Current Assignee: Kowa Company, Ltd.
- Current Assignee Address: JP Nagoya-shi
- Agency: Miller, Matthias & Hull LLP
- Priority: JP2007-062899 20070313
- International Application: PCT/JP2008/054272 WO 20080310
- International Announcement: WO2008/111550 WO 20080918
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01B11/30 ; A61B3/14

Abstract:
There is provided an image analysis system which captures image data of an arbitrary pair of a first image RI and a second image LI among images obtained by color-photographing a single object from different positions into an analysis computer, wherein the computer includes corresponding point extraction means for assigning a weighing factor to a pixel information value based on the contrast size of the pixel information value in each of a first local area ROI1 set around an arbitrary reference point in RI and second local areas ROI2s at which scanning is performed on LI, calculating the similarity between ROI1 and ROI2s, and extracting a corresponding point which corresponds to the reference point from a ROI2 having the highest similarity, and depth information calculating means for calculating depth information of the object based on coordinates of the reference point and the corresponding point.
Public/Granted literature
- US20100142852A1 Image Analysis System and Image Analysis Program Public/Granted day:2010-06-10
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