Invention Grant
- Patent Title: Electronic self-calibration for sensor clearance
- Patent Title (中): 电子自校准传感器间隙
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Application No.: US12241499Application Date: 2008-09-30
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Publication No.: US08272246B2Publication Date: 2012-09-25
- Inventor: Emad Andarawis Andarawis , Wayne Charles Hasz , David So Keung Chan , David Mulford Shaddock , John Harry Down , Samhita Dasgupta , David Richard Esler , Zhiyuan Ren , Mahadevan Balasubramaniam , Ibrahim Issoufou Kouada
- Applicant: Emad Andarawis Andarawis , Wayne Charles Hasz , David So Keung Chan , David Mulford Shaddock , John Harry Down , Samhita Dasgupta , David Richard Esler , Zhiyuan Ren , Mahadevan Balasubramaniam , Ibrahim Issoufou Kouada
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Scott J. Asmus
- Main IPC: G01B21/00
- IPC: G01B21/00

Abstract:
Self-calibration of a multiple channel clearance sensor system, which in one embodiment includes at least one sensor for measuring at least one clearance parameter signal between a stationary object and a rotating object of a rotating machine. The sensor output is processed as a clearance parameter by an offset correction section configured to determine an offset error in the clearance parameter signal which is used by a level shifter. The level shifter is also switchably coupled to the clearance parameter signal wherein the output of the level shifter, which may be amplified and digitally converted, is processed by a signal level analyzer to determine a channel gain signal.
Public/Granted literature
- US20100077830A1 ELECTRONIC SELF-CALIBRATION FOR SENSOR CLEARANCE Public/Granted day:2010-04-01
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