发明授权
- 专利标题: Specimen identification system and specimen identification device
- 专利标题(中): 标本识别系统和标本识别装置
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申请号: US13430326申请日: 2012-03-26
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公开(公告)号: US08274052B1公开(公告)日: 2012-09-25
- 发明人: Hideaki Fukuzawa , Hiromi Yuasa
- 申请人: Hideaki Fukuzawa , Hiromi Yuasa
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 主分类号: G01J5/02
- IPC分类号: G01J5/02
摘要:
In a specimen identification system, an oscillator directs a THz wave toward a channel that accommodates a specimen. A receiver detects the THz wave transmitted through the specimen. A first controller controls the oscillator to sweep the oscillation frequency of the THz wave within a frequency band. A receiver generates a receiving signal by sweeping the receiving frequency of the THz wave within the frequency band. A specimen identification unit specifies the specimen based on the waveform of the receiving signal within the frequency band.
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