Invention Grant
- Patent Title: Wide band gap semiconductor device including junction field effect transistor
- Patent Title (中): 宽带隙半导体器件包括结场效应晶体管
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Application No.: US12458968Application Date: 2009-07-28
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Publication No.: US08274086B2Publication Date: 2012-09-25
- Inventor: Rajesh Kumar Malhan , Yuuichi Takeuchi , Jeremy Rashid
- Applicant: Rajesh Kumar Malhan , Yuuichi Takeuchi , Jeremy Rashid
- Applicant Address: JP Kariya GB Cambridge
- Assignee: DENSO CORPORATION,University of Cambridge
- Current Assignee: DENSO CORPORATION,University of Cambridge
- Current Assignee Address: JP Kariya GB Cambridge
- Agency: Posz Law Group, PLC
- Priority: JP2008-196107 20080730
- Main IPC: H01L29/15
- IPC: H01L29/15 ; H01L31/0256

Abstract:
A wide band gap semiconductor device has a transistor cell region, a diode forming region, an electric field relaxation region located between the transistor cell region and the diode forming region, and an outer peripheral region surrounding the transistor cell region and the diode forming region. In the transistor cell region, a junction field effect transistor is disposed. In the diode forming region, a diode is disposed. In the electric field relaxation region, an isolating part is provided. The isolating part includes a trench dividing the transistor cell region and the diode forming region, a first conductivity-type layer disposed on an inner wall of the trench, and a second conductivity-type layer disposed on a surface of the first conductivity-type layer so as to fill the trench. The first conductivity-type layer and the second conductivity-type layer provide a PN junction.
Public/Granted literature
- US20100025693A1 Wide band gap semiconductor device including junction field effect transistor Public/Granted day:2010-02-04
Information query
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