Invention Grant
- Patent Title: Method for measuring luminescence at a luminescence detection workstation
- Patent Title (中): 用于在发光检测工作站测量发光的方法
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Application No.: US12716219Application Date: 2010-03-02
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Publication No.: US08278114B2Publication Date: 2012-10-02
- Inventor: Michael Gambini , Jeff Levi , John Voyta , John Atwood , Bruce De Simas , Edward Lakatos , Israel Metal , George Sabak , Yongdong Wang
- Applicant: Michael Gambini , Jeff Levi , John Voyta , John Atwood , Susan Atwood-Stone, legal representative , Bruce De Simas , Edward Lakatos , Israel Metal , George Sabak , Yongdong Wang
- Applicant Address: US CA Carlsbad
- Assignee: Applied Biosystems, LLC
- Current Assignee: Applied Biosystems, LLC
- Current Assignee Address: US CA Carlsbad
- Main IPC: G01N21/76
- IPC: G01N21/76 ; G01T1/10
Abstract:
A luminescence detecting apparatus and method for analyzing luminescent samples is disclosed. A detecting apparatus may be configured so that light from luminescent samples pass through a collimator, a a first lens, a filter, and a camera lens, whereupon an image is created by the optics on the charge-coupled device (CCD) camera. The detecting apparatus may further include central processing control of all operations, multiple wavelength filter wheel, and/or a robot for handling of samples and reagents.
Public/Granted literature
- US20100248387A1 Method for Measuring Luminescence at a Luminescence Detection Workstation Public/Granted day:2010-09-30
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