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    METHOD FOR MEASURING LUMINESCENCE AT A LUMINESCENCE DETECTION WORKSTATION
    4.
    发明申请
    METHOD FOR MEASURING LUMINESCENCE AT A LUMINESCENCE DETECTION WORKSTATION 有权
    用于在发光检测工作站测量发光的方法

    公开(公告)号：US20120309103A1

    公开(公告)日：2012-12-06

    申请号：US13584628

    申请日：2012-08-13

    申请人： Michael Gambini ,  John C. Voyta ,  John Atwood ,  Susan A. Atwood-Stone ,  Bruce E. DeSimas, II ,  Edward Lakatos ,  Jeff Levi ,  Israel Metal ,  George Sabak ,  Yongdong Wang

    发明人： Michael Gambini ,  John C. Voyta ,  John Atwood ,  Susan A. Atwood-Stone ,  Bruce E. DeSimas, II ,  Edward Lakatos ,  Jeff Levi ,  Israel Metal ,  George Sabak ,  Yongdong Wang

    IPC分类号： G01N21/76

    CPC分类号： G01N21/763 ,  G01N21/15 ,  G01N21/274 ,  G01N21/276 ,  G01N21/31 ,  G01N21/6452 ,  G01N21/6456 ,  G01N21/6486 ,  G01N21/76 ,  G01N33/581 ,  G01N2021/6471 ,  G01N2333/90241 ,  Y10T436/115831

    摘要： A luminescence detecting apparatus and method for analyzing luminescent samples is disclosed. Luminescent samples are placed in a plurality of sample wells in a tray, and the tray is placed in a visible-light impervious chamber containing a charge coupled device camera. The samples may be injected in the wells, and the samples may be injected with buffers and reagents, by an injector. In the chamber, light from the luminescent samples pass through a collimator, a Fresnel field lens, a filter, and a camera lens, whereupon a focused image is created by the optics on the charge-coupled device (CCD) camera. The use of a Fresnel field lens, in combination with a collimator and filter, reduces crosstalk between samples below the level attainable by the prior art. Preferred embodiments of the luminescence detecting apparatus and method disclosed include central processing control of all operations, multiple wavelength filter wheel, and robot handling of samples and reagents. Preferred embodiments of processing software integrated with the invention include elements for mechanical alignment, outlier shaving, edge detection and masking, manipulation of multiple integration times to expand the dynamic range, crosstalk correction, dark subtraction interpolation and drift correction, multi-component analysis applications specifically tailored for luminescence, and uniformity correction.

    摘要翻译： 公开了一种用于分析发光样品的发光检测装置和方法。 将发光样品放置在托盘中的多个样品孔中，并且将托盘放置在包含电荷耦合器件照相机的可见光不透水室中。 样品可以注入孔中，样品可以通过注射器注入缓冲液和试剂。 在室中，来自发光样品的光通过准直仪，菲涅尔场透镜，滤光器和照相机镜头，由此电荷耦合器件（CCD）照相机上的光学器件产生聚焦图像。 使用菲涅耳场透镜与准直器和滤光器结合使得样品之间的串扰降低到现有技术可获得的水平以下。 发光检测装置和方法的优选实施例包括所有操作，多波长滤光轮和样品和试剂的机器人处理的中央处理控制。 与本发明集成的处理软件的优选实施例包括用于机械对准，异常刮削，边缘检测和掩蔽的元件，多次积分时间的操纵以扩大动态范围，串扰校正，暗减法内插和漂移校正，特别是多组分分析应用 适合发光和均匀性校正。

    Radiation scanning systems and methods
    6.
    发明申请
    Radiation scanning systems and methods 有权
    辐射扫描系统和方法

    公开(公告)号：US20080025464A1

    公开(公告)日：2008-01-31

    申请号：US11704905

    申请日：2007-02-09

    申请人： Andrew Foland ,  Richard Eilbert ,  Michael Gambini ,  Boris Oreper ,  Nikolay Rolshud

    发明人： Andrew Foland ,  Richard Eilbert ,  Michael Gambini ,  Boris Oreper ,  Nikolay Rolshud

    IPC分类号： G01N23/10

    CPC分类号： G01N23/04

    摘要： An apparatus may comprise a frame supporting at least first and second skewed radiation sources and at least first and second radiation detectors. The first and second radiation detectors may be substantially non-contiguous such that a substantial gap exists between the first and second radiation detectors that is free of any radiation detectors. Each of the first and second radiation detectors may also configured and arranged to detect radiation emitted by each of the first and second skewed radiation sources.

    摘要翻译： 装置可以包括支撑至少第一和第二偏斜辐射源的框架，以及至少第一和第二辐射检测器。 第一和第二辐射检测器可以基本上不连续，使得在没有任何辐射检测器的第一和第二辐射检测器之间存在实质的间隙。 第一和第二辐射检测器中的每一个也可以被配置和布置成检测由第一和第二偏斜辐射源中的每一个发射的辐射。