Invention Grant
- Patent Title: Gas analyzer
- Patent Title (中): 气体分析仪
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Application No.: US12595821Application Date: 2008-04-02
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Publication No.: US08296090B2Publication Date: 2012-10-23
- Inventor: Junji Aoki , Hirokazu Kitaura , Said Boumsellek
- Applicant: Junji Aoki , Hirokazu Kitaura , Said Boumsellek
- Applicant Address: JP Kyoto-shi
- Assignee: Horiba STEC, Co., Ltd.
- Current Assignee: Horiba STEC, Co., Ltd.
- Current Assignee Address: JP Kyoto-shi
- Agency: Alleman Hall McCoy Russell & Tuttle LLP
- Priority: JP2007-105648 20070413
- International Application: PCT/JP2008/056591 WO 20080402
- International Announcement: WO2008/129929 WO 20081030
- Main IPC: G01L27/00
- IPC: G01L27/00 ; G01L15/00

Abstract:
A gas analyzer using a quadrupole mass spectrometric method etc. is provided with an ionizer to ionize a sample gas, a first ion detector and a second ion detector each configured to detect a respective ion from ionizer, and each being disposed a respective distance from the ionizer on an opposite side of the ionizer, the respective distances being different from each other, a filter interposed between the ionizer and the first ion detector to selectively allow ions from the ionizer to pass therethrough, and an arithmetic device to correct a partial pressure of a specific component obtained from the first ion detector and selected by the filter by using a first total pressure of the sample gas obtained from the first ion detector and a second total pressure of the sample gas obtained from the second ion detector.
Public/Granted literature
- US20100076712A1 GAS ANALYZER Public/Granted day:2010-03-25
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