A system and method for testing derating performance of a component obtains a component list, a pin list, and a standard derating list of the electronic device from a storage. The system and method further receives parameters of each component, the parameters of each component comprising voltages of two pins of the component and a working temperature of the component, calculates a working voltage and a derating ratio of the component according to the parameters. The system and method also analyzes the working voltage and the derating ratio of the component to get analysis result, generates a test report comprising the derating ratio, the working temperature, the analysis results of each component in the component list, and storing the test report in the storage.