Invention Grant
- Patent Title: Optical testing apparatus and testing method thereof
- Patent Title (中): 光学测试仪器及其测试方法
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Application No.: US12909959Application Date: 2010-10-22
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Publication No.: US08300103B2Publication Date: 2012-10-30
- Inventor: Jin-Min He
- Applicant: Jin-Min He
- Applicant Address: CN ShenZhen, Guangdong Province HK Kowloon
- Assignee: Shenzhen Futaihong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- Current Assignee: Shenzhen Futaihong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- Current Assignee Address: CN ShenZhen, Guangdong Province HK Kowloon
- Agency: Altis Law Group, Inc.
- Priority: CN201010181077 20100524
- Main IPC: H04N17/00
- IPC: H04N17/00 ; H04N17/02 ; G01K1/08 ; G01K1/14 ; G01K13/00

Abstract:
An optical testing apparatus can be operated according to a testing method to test quality of an imaging module of an electronic device. The optical testing apparatus includes a projector, a temperature control device, a processor, and a controller. The controller can control the imaging module to capture an image from the projector and transmit the captured image to the processor. The processor processes the captured image to determine the quality of the imaging module.
Public/Granted literature
- US20110285857A1 OPTICAL TESTING APPARATUS AND TESTING METHOD THEREOF Public/Granted day:2011-11-24
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