Invention Grant
- Patent Title: Semiconductor memory apparatus and test method thereof
- Patent Title (中): 半导体存储器及其测试方法
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Application No.: US12948874Application Date: 2010-11-18
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Publication No.: US08300496B2Publication Date: 2012-10-30
- Inventor: Tae Sik Yun , Hyung Dong Lee , Jun Gi Choi , Sang Jin Byeon , Sang Hoon Shin
- Applicant: Tae Sik Yun , Hyung Dong Lee , Jun Gi Choi , Sang Jin Byeon , Sang Hoon Shin
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2010-0086491 20100903
- Main IPC: G11C8/18
- IPC: G11C8/18 ; G11C8/16 ; G11C7/00

Abstract:
A semiconductor memory apparatus includes a clock control unit configured to receive a first clock when an enable signal is activated and generate a second clock which has a cycle closer in length to a target clock cycle than the first clock; a DLL input clock generation unit configured to output one of the first clock and the second clock as a DLL input clock according to a DLL select signal; and an address/command input clock generation unit configured to output one of the first clock and the second clock as an AC input clock according to the enable signal.
Public/Granted literature
- US20120057413A1 SEMICONDUCTOR MEMORY APPARATUS AND TEST METHOD THEREOF Public/Granted day:2012-03-08
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