Invention Grant
- Patent Title: Delay locked loop circuit and method
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Application No.: US13476393Application Date: 2012-05-21
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Publication No.: US08305120B2Publication Date: 2012-11-06
- Inventor: Feng Lin
- Applicant: Feng Lin
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman, Lundberg & Woessner, P.A.
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
Delay locked loop circuits and methods are disclosed. In the embodiments, a delay locked loop may include a phase detector to detect a phase difference between a clock signal and a reference clock signal, and a charge pump that receives the detected phase difference. A low pass filter may filter an output from the charge pump. The delay locked loop may further include a delay line having a plurality of delay elements, the plurality of delay elements including a first selectable group and a second selectable group that is larger than the first selectable group. A first clock signal from the first group of delay elements may be provided to the phase detector to first synchronize the delay locked loop, and following the synchronization, a second clock signal from the second group may be employed to synchronize the delay locked loop.
Public/Granted literature
- US20120230135A1 DELAY LOCKED LOOP CIRCUIT AND METHOD Public/Granted day:2012-09-13
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