Invention Grant
- Patent Title: Methods and apparatus for analyzing samples and collecting sample fractions
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Application No.: US12960114Application Date: 2010-12-03
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Publication No.: US08305582B2Publication Date: 2012-11-06
- Inventor: James Anderson , Raaidah Saari-Nordhaus , Washington Mendoza , Josef Bystron , Dirk Helgemo , Dennis McCreary
- Applicant: James Anderson , Raaidah Saari-Nordhaus , Washington Mendoza , Josef Bystron , Dirk Helgemo , Dennis McCreary
- Applicant Address: US MD Columbia
- Assignee: Alltech Associates, Inc.
- Current Assignee: Alltech Associates, Inc.
- Current Assignee Address: US MD Columbia
- Agent William D. Bunch
- Main IPC: G01N21/00
- IPC: G01N21/00
Abstract:
Methods and apparatus for analyzing a sample using at least one detector are disclosed.
Public/Granted literature
- US20110301865A1 Methods and Apparatus for Analyzing Samples and Collecting Sample Fractions Public/Granted day:2011-12-08
Information query
