Invention Grant
- Patent Title: Sample cooling apparatus
- Patent Title (中): 样品冷却装置
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Application No.: US11730896Application Date: 2007-04-04
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Publication No.: US08307665B2Publication Date: 2012-11-13
- Inventor: Yasushi Nagamune
- Applicant: Yasushi Nagamune
- Applicant Address: JP Tokyo
- Assignee: National Institute of Advanced Industrial Science and Technology
- Current Assignee: National Institute of Advanced Industrial Science and Technology
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2006-105586 20060406
- Main IPC: F25B9/00
- IPC: F25B9/00 ; F25B19/00

Abstract:
A sample cooling apparatus capable of cooling and holding samples or wafers at a cryogenic temperature with no vibration or drift with respect to a measurement reference surface is disclosed. In the sample cooling apparatus, a sample holder is arranged in a vacuum vessel mounted on a housing having a table for forming a measurement reference surface to be supported by a thermal insulator. A frame is disposed within the housing to be supported by a first buffer. A refrigerating machine is disposed in the frame to be supported by a second buffer and has a head directed to the vacuum vessel. The cooling head of the refrigerating machine is connected to the sample holder by way of a flexible thermal conduction member.
Public/Granted literature
- US20070234751A1 Sample cooling apparatus Public/Granted day:2007-10-11
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