Invention Grant
- Patent Title: Method for quantification of analytes in a titanium, tin or silicon tetrachloride sample
- Patent Title (中): 用于定量钛,锡或四氯化硅样品中分析物的方法
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Application No.: US12623846Application Date: 2009-11-23
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Publication No.: US08309361B2Publication Date: 2012-11-13
- Inventor: Lisa Edith Helberg , Jane Ramsey Marsh , Craig Steven Westphal
- Applicant: Lisa Edith Helberg , Jane Ramsey Marsh , Craig Steven Westphal
- Applicant Address: US DE Wilmington
- Assignee: E I du Pont de Nemours and Company
- Current Assignee: E I du Pont de Nemours and Company
- Current Assignee Address: US DE Wilmington
- Agent Gregory J. Feulner
- Main IPC: H01J49/26
- IPC: H01J49/26 ; C09K3/00

Abstract:
This disclosure relates to a method for detecting at least one analyte in a tetrachloride sample comprising titanium, tin or silicon tetrachloride; comprising, (a) adding a mixture of water and acid, typically hydrochloric acid, to the sample under conditions effective for forming an aqueous solution of the sample; (b) introducing the aqueous solution of the sample into an inductively coupled mass spectrometer having a cell selected from the group of a reactive cell and a collision cell or both and producing an analyte ion comprising an interfering species; (c) contacting the analyte ion with a gas to produce a product which is substantially free from the interfering species; and (d) detecting and measuring at least one signal from the analyte in the solution. This disclosure further relates to a method for making an aqueous titanium, tin or silicon tetrachloride sample suitable for analysis in using inductively coupled plasma mass spectroscopy.
Public/Granted literature
- US20100065736A1 METHOD FOR QUANTIFICATION OF ANALYTES IN A TITANIUM, TIN OR SILICON TETRACHLORIDE SAMPLE Public/Granted day:2010-03-18
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