Invention Grant
- Patent Title: Angled dual-polarity mass spectrometer
- Patent Title (中): 角度双极性质谱仪
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Application No.: US12689506Application Date: 2010-01-19
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Publication No.: US08309913B2Publication Date: 2012-11-13
- Inventor: Yi-Sheng Wang , Chung-Hsuan Chen
- Applicant: Yi-Sheng Wang , Chung-Hsuan Chen
- Applicant Address: TW Taipei
- Assignee: Academia Sinica
- Current Assignee: Academia Sinica
- Current Assignee Address: TW Taipei
- Agency: Fish & Richardson P.C.
- Main IPC: H01J49/10
- IPC: H01J49/10

Abstract:
An angled dual-polarity mass spectrometer includes a dual-polarity ion generator, a first mass analyzer, and a second mass analyzer. The dual-polarity ion generator includes an ion source to generate positive ions and negative ions from a sample, and electrodes to generate electric fields for guiding the negative ions into a beam of negative ions and guiding the positive ions into a beam of positive ions. The first mass analyzer can analyze the negative ions, and the second mass analyzer can analyze the positive ions. The central axes of the first and the second mass analyzers are at an angle between 0 to 179 degrees.
Public/Granted literature
- US20100181474A1 Angled Dual-Polarity Mass Spectrometer Public/Granted day:2010-07-22
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