发明授权
- 专利标题: Method and apparatus for evaluating dielectrophoretic intensity of microparticle
- 专利标题(中): 评估微粒介质电泳强度的方法和装置
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申请号: US12374048申请日: 2006-07-19
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公开(公告)号: US08313628B2公开(公告)日: 2012-11-20
- 发明人: Yoshio Tsunazawa , Yukihisa Wada , Naoji Moriya , Kenji Takubo , Shinichiro Totoki , Haruo Shimaoka
- 申请人: Yoshio Tsunazawa , Yukihisa Wada , Naoji Moriya , Kenji Takubo , Shinichiro Totoki , Haruo Shimaoka
- 申请人地址: JP Kyoto
- 专利权人: Shimadzu Corporation
- 当前专利权人: Shimadzu Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: Cheng Law Group, PLLC
- 国际申请: PCT/JP2006/314221 WO 20060719
- 国际公布: WO2008/010267 WO 20080124
- 主分类号: B03C5/02
- IPC分类号: B03C5/02
摘要:
A distribution of AC electric field regularly arranged in a cell is formed while storing a sample having particles dispersed in a medium in the cell, whereby the particles are dielectrically migrated in the medium to generate a diffraction grating by density distribution of the particles. Diffracted light generated by irradiating the diffraction grating by density distribution with measuring light is detected, and evaluation of dielectrophoretic intensities of the particles and/or the medium is performed from the detection result. According to this method, evaluation of dielectrophoretic characteristics can be performed without adhering a phosphor to particles, and since even a particle small in size can achieve a detection level by collecting a number of such particles to form a diffraction grating, dielectric characteristics of microparticles of several nanometers in diameter can be thus quantitatively measured with high sensitivity.
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