发明授权
- 专利标题: Isolation of ions in overloaded RF ion traps
- 专利标题(中): 过载RF离子阱中离子的分离
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申请号: US13037792申请日: 2011-03-01
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公开(公告)号: US08324566B2公开(公告)日: 2012-12-04
- 发明人: Desmond Allen Kaplan , Andreas Brekenfeld , Christoph Gebhardt , Ralf Hartmer
- 申请人: Desmond Allen Kaplan , Andreas Brekenfeld , Christoph Gebhardt , Ralf Hartmer
- 申请人地址: DE Bremen
- 专利权人: Bruker Daltonik GmbH
- 当前专利权人: Bruker Daltonik GmbH
- 当前专利权人地址: DE Bremen
- 代理机构: Law Offices of Paul E. Kudirka
- 主分类号: B01D59/44
- IPC分类号: B01D59/44 ; H01J49/00
摘要:
In an RF quadrupole ion trap having electrodes to which RF voltages are applied, ions having m/z ratios outside of a predefined narrow range of charge-related masses m/z are removed from the trap by applying a DC voltage pulse to at least one of the trap electrodes to remove from the trap the ions with high values of charge-related masses. The DC voltage pulse is preferably applied in combination with a variation of the RF voltage amplitudes to simultaneously remove from the trap ions of low charge-related masses. The DC and RF voltage amplitudes are changed in such a manner that any excitation of ions having charge-related masses within the predefined range by frequency mixtures is avoided.
公开/授权文献
- US20120223222A1 ISOLATION OF IONS IN OVERLOADED RF ION TRAPS 公开/授权日:2012-09-06
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