发明授权
- 专利标题: Measurement apparatus
- 专利标题(中): 测量装置
-
申请号: US12556670申请日: 2009-09-10
-
公开(公告)号: US08326567B2公开(公告)日: 2012-12-04
- 发明人: Takahiro Masumura
- 申请人: Takahiro Masumura
- 申请人地址: JP Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo
- 代理机构: Fitzpatrick, Cella, Harper & Scinto
- 优先权: JP2008-237253 20080917
- 主分类号: G06M7/02
- IPC分类号: G06M7/02 ; G06M7/08 ; G01N30/16 ; G01N30/18
摘要:
A measurement apparatus includes an elastic detector configured to detect an elastic wave by utilizing photoacoustic tomography and to convert the elastic wave into a detection signal, and a signal processor configured to calculate an absorption characteristic of a heterogeneous part included in a homogeneous part of a scattering medium based on μa=2P(z)/(ΓΦ(z)) where μa is the absorption coefficient at distance z from the light source, P(z) is the pressure of the elastic wave at distance z, Γ is a Grüneisen coefficient, and Φ(z) is the light intensity at the position of the heterogeneous part, the signal processor obtaining the light intensity by approximating a signal component derived from the homogeneous part separated from a signal component derived from the heterogeneous part in the scattering medium by utilizing the detection signal output from the elastic wave detector.
公开/授权文献
- US20100070233A1 MEASUREMENT APPARATUS 公开/授权日:2010-03-18
信息查询