Invention Grant
- Patent Title: System and method for testing a circuit
- Patent Title (中): 用于测试电路的系统和方法
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Application No.: US12696932Application Date: 2010-01-29
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Publication No.: US08339139B2Publication Date: 2012-12-25
- Inventor: Jens Barrenscheen , Dirk Hammerschmidt
- Applicant: Jens Barrenscheen , Dirk Hammerschmidt
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater & Matsil, L.L.P.
- Main IPC: G01R31/327
- IPC: G01R31/327 ; G01R31/02

Abstract:
In one embodiment, a sensor for circuit testing has a first terminal and a second terminal. The first terminal is configured to be coupled to a first node of a first circuit via a first capacitor, and the second terminal is configured to be coupled to a second node of the first circuit. The sensor also has at least one transmitter and at least one receiver that measures a first transmission factor between the first terminal and the second terminal. The sensor determines that the first circuit is in a first state if the first transmission factor is above a first threshold, and determines that the first circuit is in a second state if the first transmission factor is below the first threshold.
Public/Granted literature
- US20110187376A1 System and Method for Testing a Circuit Public/Granted day:2011-08-04
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