Invention Grant
US08339888B2 Memory devices having programmable elements with accurate operating parameters stored thereon
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存储器件具有存储在其上的精确操作参数的可编程元件
- Patent Title: Memory devices having programmable elements with accurate operating parameters stored thereon
- Patent Title (中): 存储器件具有存储在其上的精确操作参数的可编程元件
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Application No.: US13276592Application Date: 2011-10-19
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Publication No.: US08339888B2Publication Date: 2012-12-25
- Inventor: Jeffrey W. Janzen , Scott Schaefer , Todd D. Farrell
- Applicant: Jeffrey W. Janzen , Scott Schaefer , Todd D. Farrell
- Applicant Address: US NY Mt. Kisco
- Assignee: Round Rock Research, LLC
- Current Assignee: Round Rock Research, LLC
- Current Assignee Address: US NY Mt. Kisco
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- Main IPC: G11C17/18
- IPC: G11C17/18

Abstract:
A system with a memory device having programmable elements used to configure a memory system. More specifically, programmable elements, such as antifuses, located on a memory device are programmed during fabrication with measured operating parameters corresponding to the memory device. Operating parameters may include, for example, operating current values, operating voltages, or timing parameters. The memory device is incorporated into a system. Once the memory device is incorporated into a system, the programmable elements may be accessed by a processor such that the memory system can be configured to optimally operate in accordance with the operating parameters measured for the memory device in the system.
Public/Granted literature
- US20120036314A1 MEMORY DEVICES HAVING PROGRAMMABLE ELEMENTS WITH ACCURATE OPERATING PARAMETERS STORED THEREON Public/Granted day:2012-02-09
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