发明授权
- 专利标题： Microprocessor and method for detecting faults therein
- 专利标题（中）： 用于检测故障的微处理器和方法
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申请号： US13242906申请日： 2011-09-23
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公开(公告)号： US08341473B2公开(公告)日： 2012-12-25
- 发明人: Valeria Bertacco , Todd Michael Austin , Smitha Shyam , Kypros Constantinides , Sujay Phadke
- 申请人： Valeria Bertacco , Todd Michael Austin , Smitha Shyam , Kypros Constantinides , Sujay Phadke
- 申请人地址： US MI Ann Arbor
- 专利权人： The Regents of the University of Michigan
- 当前专利权人： The Regents of the University of Michigan
- 当前专利权人地址： US MI Ann Arbor
- 代理机构： Brooks Kushman P.C.
- 主分类号： G01R31/28
- IPC分类号： G01R31/28
摘要：
A microprocessor has a silicon area comprising a plurality of transistors implemented on the silicon area and a fault detection circuit occupying less than 20% of the silicon area and configured to detect faults at runtime in at least 80% of the plurality of transistors.
公开/授权文献
- US20120011422A1 MICROPROCESSOR AND METHOD FOR DETECTING FAULTS THEREIN 公开/授权日：2012-01-12
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